Subproject B07

Characterization of Microstructured Component Surfaces

The main focus of the project B07 is the integrated, spatially resolved acquisition and characterization of geometry and material of micro-structured component surfaces on a micrometer up to nanometer scale. B07 deals with two essential objectives: The first objective is the enhancement of the model based analysis and signal processing of the DFG funded Ellipso-Height-Topometer. The second objective is the integration of a high resolution AFM-like “Akiyama”-sensor into the optical sensor setup. In addition, the data fusion of topography, material contrast and hardness measurements (in cooperation with B04) and the development of new characterization methods for confocal microscopes (in cooperation with C03) will further improve the characterization of surface morphology and contribute to the common goal of correlating with functional properties.

Principal Investigator:

Prof. Dr.-Ing. Jörg Seewig

Scientific Staff:

Dipl.-Ing. Felix Ströer
Dipl.-Ing. Georgis Bulun

Founded by


Last Change: February 22th 2019